IMG 100: Image Analysis for TEM Science
This module covers foundational image analysis techniques for Transmission Electron Microscopy (TEM) science. Each section includes lecture slides and a hands-on programming notebook.
Section 0.1.1 – Introduction to TEM/STEM
An introduction to Transmission and Scanning Transmission Electron Microscopy (TEM/STEM) instruments and their operation.
Section 0.1.2 – Histogram and Contrast
Understanding image histograms and contrast adjustment techniques for TEM images.
Section 0.1.3 – Noise Correction
Techniques for identifying and correcting noise in TEM images.
Section 0.1.4 – Drift Correction
Methods for correcting sample drift in TEM image series.
Section 0.1.5 – Measurement of Distances
Calibration and measurement of distances and lattice spacings in TEM images.
Section 0.1.6 – FFT Analysis
Using Fast Fourier Transform (FFT) analysis to extract structural information from TEM images.